噪音安全设计方法

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) Pub Date : 2000-03-20 DOI:10.1109/ISQED.2000.838869

M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni

{"title":"噪音安全设计方法","authors":"M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni","doi":"10.1109/ISQED.2000.838869","DOIUrl":null,"url":null,"abstract":"The increasing densities in growing size circuits leads us to consider as an issue noise problems such as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, whose development must then include circuit models for the analysis of noise phenomena. This paper points out a proposed methodology in the development of new models and related tools that focus on the noise immunity of circuit design.","PeriodicalId":113766,"journal":{"name":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Noise safety design methodologies\",\"authors\":\"M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni\",\"doi\":\"10.1109/ISQED.2000.838869\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The increasing densities in growing size circuits leads us to consider as an issue noise problems such as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, whose development must then include circuit models for the analysis of noise phenomena. This paper points out a proposed methodology in the development of new models and related tools that focus on the noise immunity of circuit design.\",\"PeriodicalId\":113766,\"journal\":{\"name\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-03-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2000.838869\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2000.838869","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

随着电路尺寸的增大，电路密度的增加，串扰、开关噪声、电迁移和衬底注入等噪声问题也随之出现。噪声安全必须是设计工具的明确目标，其开发必须包括用于分析噪声现象的电路模型。本文提出了一种开发新模型和相关工具的方法，重点关注电路设计的抗噪性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Noise safety design methodologies

The increasing densities in growing size circuits leads us to consider as an issue noise problems such as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, whose development must then include circuit models for the analysis of noise phenomena. This paper points out a proposed methodology in the development of new models and related tools that focus on the noise immunity of circuit design.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)

自引率

0.00%

发文量