偏置固体介质中基于微缝的太赫兹脉冲相干探测

A. Mazhorova, S. Ho, M. Clerici, M. Peccianti, A. Pasquazi, L. Razzari, J. Ali, R. Morandotti
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引用次数: 0

摘要

我们在几微米厚的二氧化硅(SiO2)样品中展示了基于太赫兹场诱导二次谐波效应的相干太赫兹表征,这种样品可以很容易地在几百伏的电压下操作。我们的样品是一个无限大的30 μm的金缝。我们工作的基本思想是利用玻璃的大击穿电压和高非线性,在中等偏置场下使用非常弱的光学探头实现大信噪比检测,从而大大减少电极间隙。我们的研究结果为宽带太赫兹探测的新方法铺平了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Micro-Slit Based Coherent Detection of Terahertz Pulses in Biased, Solid State Media
We demonstrated coherent Terahertz characterization based on the Terahertz Field Induced Second Harmonic effect in few microns thick Silica (SiO2) samples that can be easily operated with as little as a few hundred Volts. Our sample is an infinitely long 30 μm slit written in gold. The underlying idea of our work is that of exploiting the large breakdown voltage and the high nonlinearity of glass to achieve a large signal to noise ratio detection with a very weak optical probe at moderate bias fields, thus drastically reducing the electrodes gap. Our results pave the way to a novel approach towards broadband THz detection.
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