{"title":"真实CMOS网络断口的准确高效故障仿真","authors":"H. Konuk, F. Ferguson, T. Larrabee","doi":"10.1145/217474.217553","DOIUrl":null,"url":null,"abstract":"We present a new fault simulation algorithm for realistic break faults in the p-networks and n-networks of static CMOS cells. We show that Miller effects can invalidate a test just as charge sharing can, and we present a new charge-based approach that efficiently and accurately predicts the worst case effects of Miller capacitances and charge sharing together. Results on running our fault simulator on ISCAS85 benchmark circuits are provided.","PeriodicalId":422297,"journal":{"name":"32nd Design Automation Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Accurate and Efficient Fault Simulation of Realistic CMOS Network Breaks\",\"authors\":\"H. Konuk, F. Ferguson, T. Larrabee\",\"doi\":\"10.1145/217474.217553\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a new fault simulation algorithm for realistic break faults in the p-networks and n-networks of static CMOS cells. We show that Miller effects can invalidate a test just as charge sharing can, and we present a new charge-based approach that efficiently and accurately predicts the worst case effects of Miller capacitances and charge sharing together. Results on running our fault simulator on ISCAS85 benchmark circuits are provided.\",\"PeriodicalId\":422297,\"journal\":{\"name\":\"32nd Design Automation Conference\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"32nd Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/217474.217553\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"32nd Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/217474.217553","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Accurate and Efficient Fault Simulation of Realistic CMOS Network Breaks
We present a new fault simulation algorithm for realistic break faults in the p-networks and n-networks of static CMOS cells. We show that Miller effects can invalidate a test just as charge sharing can, and we present a new charge-based approach that efficiently and accurately predicts the worst case effects of Miller capacitances and charge sharing together. Results on running our fault simulator on ISCAS85 benchmark circuits are provided.
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