{"title":"表征电磁干扰滤波器的一种替代的、互补的方法","authors":"M. Mardiguian, J. Raimbourg","doi":"10.1109/ISEMC.1999.810171","DOIUrl":null,"url":null,"abstract":"Proper characterization of EMI filters has always been a problem, since real-life application never replicates the impedances of the test set-up. This paper analyzes filter insertion loss in actual EUT configurations, compared to the artificial data of Mil Std220 or CISPR 17, and recommends a complementary method using the LISN as a test load.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"An alternate, complementary method for characterizing EMI filters\",\"authors\":\"M. Mardiguian, J. Raimbourg\",\"doi\":\"10.1109/ISEMC.1999.810171\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Proper characterization of EMI filters has always been a problem, since real-life application never replicates the impedances of the test set-up. This paper analyzes filter insertion loss in actual EUT configurations, compared to the artificial data of Mil Std220 or CISPR 17, and recommends a complementary method using the LISN as a test load.\",\"PeriodicalId\":312828,\"journal\":{\"name\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1999.810171\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1999.810171","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An alternate, complementary method for characterizing EMI filters
Proper characterization of EMI filters has always been a problem, since real-life application never replicates the impedances of the test set-up. This paper analyzes filter insertion loss in actual EUT configurations, compared to the artificial data of Mil Std220 or CISPR 17, and recommends a complementary method using the LISN as a test load.