电磁兼容试验中三种新型带线透射电镜电池

2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT) Pub Date : 2016-08-01 DOI:10.1109/ICEICT.2016.7879750

Luo Wen, Guan Yalin, Li Jin

{"title":"电磁兼容试验中三种新型带线透射电镜电池","authors":"Luo Wen, Guan Yalin, Li Jin","doi":"10.1109/ICEICT.2016.7879750","DOIUrl":null,"url":null,"abstract":"The strip-line TEM cell is used to measure the EMC of equipment and devices. Strip-line TEM cell can be widely used in measuring the EMC (Electromagnetic Compatibility) performance from automotive industry to IC components. In this paper we present three different strip-line TEM cells. And cut slot on conductor can extend the frequency range of strip-line TEM cell. The cost is lower, the operation is easier, and the cell is more applicability with this method.","PeriodicalId":224387,"journal":{"name":"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Three new strip-line TEM cells in EMC test\",\"authors\":\"Luo Wen, Guan Yalin, Li Jin\",\"doi\":\"10.1109/ICEICT.2016.7879750\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The strip-line TEM cell is used to measure the EMC of equipment and devices. Strip-line TEM cell can be widely used in measuring the EMC (Electromagnetic Compatibility) performance from automotive industry to IC components. In this paper we present three different strip-line TEM cells. And cut slot on conductor can extend the frequency range of strip-line TEM cell. The cost is lower, the operation is easier, and the cell is more applicability with this method.\",\"PeriodicalId\":224387,\"journal\":{\"name\":\"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEICT.2016.7879750\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEICT.2016.7879750","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

带线TEM单元用于测量设备的电磁兼容性。从汽车工业到集成电路元件，带状TEM单元可广泛用于电磁兼容性能的测量。本文提出了三种不同的带状透射电镜细胞。在导体上开槽可以扩大带线瞬变电磁箱的频率范围。该方法成本低，操作简单，电池适用性强。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Three new strip-line TEM cells in EMC test

The strip-line TEM cell is used to measure the EMC of equipment and devices. Strip-line TEM cell can be widely used in measuring the EMC (Electromagnetic Compatibility) performance from automotive industry to IC components. In this paper we present three different strip-line TEM cells. And cut slot on conductor can extend the frequency range of strip-line TEM cell. The cost is lower, the operation is easier, and the cell is more applicability with this method.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)

自引率

0.00%

发文量