{"title":"双波长数字全息显微镜的噪声分析","authors":"Xuhui Zhang, Yuhui Yang, E. Lam, Zhimin Xu","doi":"10.1364/COSI.2019.CTU4C.5","DOIUrl":null,"url":null,"abstract":"Dual-wavelength digital holographic microscopy (DHM) can provide sub-nanometer resolution for sample profile characterization. We analyze the noise requirement for extension of the vertical measuring range and the noise suppression methods in DHM.","PeriodicalId":123636,"journal":{"name":"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Noise Analysis of Dual-wavelength Digital Holographic Microscopy\",\"authors\":\"Xuhui Zhang, Yuhui Yang, E. Lam, Zhimin Xu\",\"doi\":\"10.1364/COSI.2019.CTU4C.5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dual-wavelength digital holographic microscopy (DHM) can provide sub-nanometer resolution for sample profile characterization. We analyze the noise requirement for extension of the vertical measuring range and the noise suppression methods in DHM.\",\"PeriodicalId\":123636,\"journal\":{\"name\":\"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/COSI.2019.CTU4C.5\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/COSI.2019.CTU4C.5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Noise Analysis of Dual-wavelength Digital Holographic Microscopy
Dual-wavelength digital holographic microscopy (DHM) can provide sub-nanometer resolution for sample profile characterization. We analyze the noise requirement for extension of the vertical measuring range and the noise suppression methods in DHM.
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