{"title":"未来晶圆级CSP封装","authors":"J. Simon","doi":"10.1109/IEMTIM.1998.704504","DOIUrl":null,"url":null,"abstract":"The requirements for wafer-level CSP technology concerning reliability and cost are discussed. A simple cost calculation based on cost per I/O for single chip packaging demonstrates the advantage of wafer-level CSP-type packaging and gives a cost limit for wafer-level packaging technologies. The geometrical limitations are noted. The reliability requirements for successful implementation are described. A wafer-level packaging concept called Diepack is used to study the requirements for wafer-level packaging. It is shown that wafer-level CSP-type packaging can be achieved with \"simple\" technologies for small dice.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Future waferlevel CSP packaging\",\"authors\":\"J. Simon\",\"doi\":\"10.1109/IEMTIM.1998.704504\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The requirements for wafer-level CSP technology concerning reliability and cost are discussed. A simple cost calculation based on cost per I/O for single chip packaging demonstrates the advantage of wafer-level CSP-type packaging and gives a cost limit for wafer-level packaging technologies. The geometrical limitations are noted. The reliability requirements for successful implementation are described. A wafer-level packaging concept called Diepack is used to study the requirements for wafer-level packaging. It is shown that wafer-level CSP-type packaging can be achieved with \\\"simple\\\" technologies for small dice.\",\"PeriodicalId\":260028,\"journal\":{\"name\":\"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)\",\"volume\":\"76 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMTIM.1998.704504\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMTIM.1998.704504","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The requirements for wafer-level CSP technology concerning reliability and cost are discussed. A simple cost calculation based on cost per I/O for single chip packaging demonstrates the advantage of wafer-level CSP-type packaging and gives a cost limit for wafer-level packaging technologies. The geometrical limitations are noted. The reliability requirements for successful implementation are described. A wafer-level packaging concept called Diepack is used to study the requirements for wafer-level packaging. It is shown that wafer-level CSP-type packaging can be achieved with "simple" technologies for small dice.