基于DC- ac转换的运算放大器直流偏置电压µv级精确快速测试技术

2019 IEEE International Test Conference in Asia (ITC-Asia) Pub Date : 2019-09-01 DOI:10.1109/ITC-Asia.2019.00014

Yuto Sasaki, K. Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, A. Kuwana, K. Hatayama, Haruo Kobayashi

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引用次数: 7

摘要

本文介绍了一种高精度运算放大器小直流偏置电压的精确、快速测试技术。将斩波技术用于DC- ac转换和FFT频谱分析相结合，可以实现μ V量级的精确直流电压测量。我们还研究了热电动势效应及其对策。他们用原型测量系统进行了仿真和实验，并证实了测量线性度低至0.2 μ V的直流测量电压。为了缩短测试时间，我们还研究了将其扩展到多通道实现。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion

This paper describes an accurate and fast testing technique for small DC offset voltage of a high precision operational amplifier. Chopper techniques for DC-AC conversion and FFT spectrum analysis are combined and then accurate DC voltage measurement on the order of µV can be achieved. We have also investigated thermo-electromotive force effects and their countermeasures. Their simulations and experiments with prototype measurement systems have been carried out, and the measurement linearity up to as low as 0.2 µV of the DC measurement voltage was confirmed. We have also investigated its extension to multi-channel realization for short testing time.

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2019 IEEE International Test Conference in Asia (ITC-Asia)

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