{"title":"实验MOS故障模拟程序CSASIM","authors":"M. Kawai, J. Hayes","doi":"10.1109/DAC.1984.1585765","DOIUrl":null,"url":null,"abstract":"A prototype version of a new switch-level fault simulator for digital MOS IC's is described. The simulation program, which is called CSASIM, analyzes CSA (connector-switch-attenuator) circuit models using multiple logic values. A novel method of signal evaluation is employed, based on the superposition of bidirectional static and dynamic signals. CSASIM also allows efficient simulation of many different fault types, including stuck-at-constant, open-circuit, short-circuit, and delay faults. The internal structure and fault-simulation mechanisms of the simulator are discussed in this paper.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":"{\"title\":\"An Experimental MOS Fault Simulation Program CSASIM\",\"authors\":\"M. Kawai, J. Hayes\",\"doi\":\"10.1109/DAC.1984.1585765\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A prototype version of a new switch-level fault simulator for digital MOS IC's is described. The simulation program, which is called CSASIM, analyzes CSA (connector-switch-attenuator) circuit models using multiple logic values. A novel method of signal evaluation is employed, based on the superposition of bidirectional static and dynamic signals. CSASIM also allows efficient simulation of many different fault types, including stuck-at-constant, open-circuit, short-circuit, and delay faults. The internal structure and fault-simulation mechanisms of the simulator are discussed in this paper.\",\"PeriodicalId\":188431,\"journal\":{\"name\":\"21st Design Automation Conference Proceedings\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1984-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"42\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Design Automation Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1984.1585765\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585765","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Experimental MOS Fault Simulation Program CSASIM
A prototype version of a new switch-level fault simulator for digital MOS IC's is described. The simulation program, which is called CSASIM, analyzes CSA (connector-switch-attenuator) circuit models using multiple logic values. A novel method of signal evaluation is employed, based on the superposition of bidirectional static and dynamic signals. CSASIM also allows efficient simulation of many different fault types, including stuck-at-constant, open-circuit, short-circuit, and delay faults. The internal structure and fault-simulation mechanisms of the simulator are discussed in this paper.