不同变参数双栅隧道场效应晶体管结构的增强

Naga Swathi Tallapaneni, Megala Venkatesan
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引用次数: 0

摘要

在沟道晶体管上采用双栅极,以硅和锗形成异质结,并采用二氧化硅和二氧化铪两种氧化物材料作为异质介电材料,从而增强了TFET的结构。利用强大的二维数值模拟器Silvaco TCAD ATLAS模拟了器件的跨导、电场、表面电位和漏极电流等电学特性。详细讨论了不同类型的TFET结构。利用仿真工具对这些结构进行了分析。比较了不同结构的性能,通过减小双极电流和较好的离子电流来提高TFET的性能,需要减小漏电流。同样,亚阈值摆幅(SS)和阈值电压也需要降低。TFET主要用于具有这些参数的低功率应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhancement of Double Gate Tunnel Field Effect Transistor Structures with Different Variable Parameters
TFET is enhanced with the modified structure by the double gate used above the channel transistor with silicon and germanium forming hetero junction and used dielectric materials are two oxide materials which are silicon dioxide and hafnium dioxide as hetero-dielectric materails gate stack is being proposed. The electrical behavior of the device which includes transconductance, electric field, surface potential and drain current are presented using Silvaco TCAD ATLAS a potent 2D numerical simulator. Different types of TFET Architectures are discussed in detail. These structures analyzed by the simulation tool. The properties of different structed is compared and the performance of the TFET is enhanced by the reducing the ambipolar current and a better ION current, leakage current need to be reduced. Similarly subthreshold Swing (SS) and threshold voltage need to be lowered. TFET is mainly used for low power applications with these parameters.
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