基于CNTFET的三元SRAM电池与PCRAM电池的设计、分析与比较

S. Shreya, S. Sourav
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引用次数: 6

摘要

本文介绍了新兴存储器件,即三元SRAM单元和PCRAM单元之间的变化和比较。在纳米级器件中,碳纳米管场效应晶体管(CNTFET)表现出了令人瞩目的性能。CNTFET已被证明是硅器件的更好替代品。三元逻辑因其简单和节能而成为传统二元逻辑的更好替代品。由于减少了开销,三元逻辑已被证明是高性能数字设计的良好候选者。此外,研究人员正在努力实现技术的融合,PCRAM成为有希望的候选人。所有电路均采用32nm技术在HSPICE电路模拟器工具上进行了仿真。另一方面,利用GST对PCRAM单元进行建模,并利用HSPICE对仿真结果进行建模。本文提出了一种新的基于CNTFET的三元SRAM单元。本文还包含了许多物理参数来模拟PCRAM的行为。PCRAM器件的复位脉冲宽度为20ns,设置脉冲宽度为100μs。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design, analysis and comparison between CNTFET based ternary SRAM cell and PCRAM cell
This paper presents variation and comparison between emerging memory devices i.e, ternary SRAM cell and PCRAM cell. In nano range devices, Carbon nanotubes field effect transistor (CNTFET) have shown a remarkable performance. CNTFET has been proved as better replacement for silicon devices. Ternary logic emerges as better alternative to the conventional binary logic because of its simplicity and energy efficiency. Ternary logic has been proven as good candidate for high performance digital designs because of reduced overhead. Also the researchers are working towards amalgamation of techniques and PCRAM emerged as promising candidate. All the circuits have been simulated on HSPICE circuit simulator tool using 32nm technology. On the other hand, PCRAM cell using GST and the simulation result has been done using HSPICE modeling. In this paper a new CNTFET based Ternary SRAM cell has been proposed. The paper also contains numerous physical parameters to model PCRAM behavior. A PCRAM device exhibits the reset pulse width at 20ns and set pulse width at 100μs.
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