低压电力主暂态设计的一致性

W. Rhoades
{"title":"低压电力主暂态设计的一致性","authors":"W. Rhoades","doi":"10.1109/NSEMC.1989.37194","DOIUrl":null,"url":null,"abstract":"It is argued that the conditions and problems for high-voltage protection in the 1920s to 1940s are similar to those prevailing today for low-voltage (under 1000 V RMS) power system transient protection. Data are now being collected beyond voltage crest values vs. occurrence rate such as: waveshape epoch, rate of rise, ringing periods, energy, and energy spectral density. Protection design is complicated by the wide diversity of equipment designs which are installed, differing site conditions, and the effects of load on the power main distribution with transients ranging from electrically fast nanosecond duration to very long duration. Since no present standard can adequately test for these transients, low-voltage transient protection standards are being revised. The updating of the database and equipment testing can result in better cost-effective surge protection.<<ETX>>","PeriodicalId":408694,"journal":{"name":"National Symposium on Electromagnetic Compatibility","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Congruence of low voltage power main transient designs\",\"authors\":\"W. Rhoades\",\"doi\":\"10.1109/NSEMC.1989.37194\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It is argued that the conditions and problems for high-voltage protection in the 1920s to 1940s are similar to those prevailing today for low-voltage (under 1000 V RMS) power system transient protection. Data are now being collected beyond voltage crest values vs. occurrence rate such as: waveshape epoch, rate of rise, ringing periods, energy, and energy spectral density. Protection design is complicated by the wide diversity of equipment designs which are installed, differing site conditions, and the effects of load on the power main distribution with transients ranging from electrically fast nanosecond duration to very long duration. Since no present standard can adequately test for these transients, low-voltage transient protection standards are being revised. The updating of the database and equipment testing can result in better cost-effective surge protection.<<ETX>>\",\"PeriodicalId\":408694,\"journal\":{\"name\":\"National Symposium on Electromagnetic Compatibility\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"National Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSEMC.1989.37194\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"National Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSEMC.1989.37194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

认为20世纪20年代至40年代高压保护的条件和问题与今天低压(RMS小于1000 V)电力系统暂态保护的条件和问题相似。现在收集的数据不仅仅是电压峰值与发生率的关系,比如:波形历元、上升速率、振铃周期、能量和能谱密度。由于所安装的设备设计的多样性,不同的现场条件,以及负载对电力主配电的影响,从电快的纳秒持续时间到非常长的持续时间,保护设计变得复杂。由于目前没有标准可以充分测试这些瞬变,低压瞬变保护标准正在修订中。数据库的更新和设备测试可以带来更好的成本效益的电涌保护。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Congruence of low voltage power main transient designs
It is argued that the conditions and problems for high-voltage protection in the 1920s to 1940s are similar to those prevailing today for low-voltage (under 1000 V RMS) power system transient protection. Data are now being collected beyond voltage crest values vs. occurrence rate such as: waveshape epoch, rate of rise, ringing periods, energy, and energy spectral density. Protection design is complicated by the wide diversity of equipment designs which are installed, differing site conditions, and the effects of load on the power main distribution with transients ranging from electrically fast nanosecond duration to very long duration. Since no present standard can adequately test for these transients, low-voltage transient protection standards are being revised. The updating of the database and equipment testing can result in better cost-effective surge protection.<>
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