Message from the General Chairs

It gives us great pleasure to welcome you to the 1996 International Symposium on Defect and Fault Tolerance in VLSI Systems held in Boston, MA. This symposium is a successor to the Design for Yield Workshop (Oxford, UK) and the Workshops on Defect and Fault Tolerance in VLSI Systems in 1988 (Springfield, MA), 1989 (Tampa, FL), 1990 (Grenoble, France), 1991 (Hidden Valley, PA), 1992 (Dallas, TX), 1993 (Venice, Italy), 1994 (Montreal, Canada), and 1995 (Lafayette, LA). This annual meeting has already established itself as the major international forum for researchers and practitioners from industry and academia to discuss state-of-the-art techniques for defect and fault tolerance at the integrated circuit level.