Nibedita Karmokar, Meghna Madhusudan, A. Sharma, R. Harjani, Mark Po-Hung Lin, S. Sapatnekar
{"title":"有源和无源器件的共质心布局:回顾与展望","authors":"Nibedita Karmokar, Meghna Madhusudan, A. Sharma, R. Harjani, Mark Po-Hung Lin, S. Sapatnekar","doi":"10.1109/ASP-DAC52403.2022.9712576","DOIUrl":null,"url":null,"abstract":"This paper presents an overview of common-centroid (CC) layout styles, used in analog designs to overcome the impact of systematic variations. CC layouts must be carefully engineered to minimize the impact of mismatch. Algorithms for CC layout must be aware of routing parasitics, layout-dependent effects (for active devices), and the performance impact of layout choices. The optimal CC layout further depends on factors such as the choice of the unit device and the relative impact of uncorrelated and systematic variations. The paper also examines scenarios where non-CC layouts may be preferable to CC layouts.","PeriodicalId":239260,"journal":{"name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Common-Centroid Layout for Active and Passive Devices: A Review and the Road Ahead\",\"authors\":\"Nibedita Karmokar, Meghna Madhusudan, A. Sharma, R. Harjani, Mark Po-Hung Lin, S. Sapatnekar\",\"doi\":\"10.1109/ASP-DAC52403.2022.9712576\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an overview of common-centroid (CC) layout styles, used in analog designs to overcome the impact of systematic variations. CC layouts must be carefully engineered to minimize the impact of mismatch. Algorithms for CC layout must be aware of routing parasitics, layout-dependent effects (for active devices), and the performance impact of layout choices. The optimal CC layout further depends on factors such as the choice of the unit device and the relative impact of uncorrelated and systematic variations. The paper also examines scenarios where non-CC layouts may be preferable to CC layouts.\",\"PeriodicalId\":239260,\"journal\":{\"name\":\"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-01-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASP-DAC52403.2022.9712576\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASP-DAC52403.2022.9712576","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Common-Centroid Layout for Active and Passive Devices: A Review and the Road Ahead
This paper presents an overview of common-centroid (CC) layout styles, used in analog designs to overcome the impact of systematic variations. CC layouts must be carefully engineered to minimize the impact of mismatch. Algorithms for CC layout must be aware of routing parasitics, layout-dependent effects (for active devices), and the performance impact of layout choices. The optimal CC layout further depends on factors such as the choice of the unit device and the relative impact of uncorrelated and systematic variations. The paper also examines scenarios where non-CC layouts may be preferable to CC layouts.