CMOS电路中的亚阈值泄漏降低技术

S. Banu, Shweta Gupta
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引用次数: 3

摘要

在涉及CMOS电路的超大规模集成电路中,最小化泄漏功率已成为低压、低功耗和高性能应用的主要关注点之一。本文的第一部分描述了低功耗的需求和在技术缩放和功率元件方面的缺点。第二部分描述了泄漏功率的各种来源以及在不影响性能的情况下降低泄漏功率所涉及的各种技术。可以在工艺和电路级别采用各种降低功耗的技术,包括晶体管堆叠,多阈值(MTCMOS),动态阈值,双阈值,可变阈值(VTCMOS),引脚重新排序,电源电压缩放和堆叠技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Sub-Threshold Leakage Reduction Techniques in CMOS Circuits
Minimizing the leakage power has become one of the major concerns in low-voltage, low-power and high performance applications in VLSI involving CMOS circuits. The first part of this paper describes the need for low power and drawbacks in technology scaling and power components. The second part describes the various sources of leakage power and various techniques involved in reducing the same without affecting the performance. Various power reduction techniques can be employed at process and circuit level which includes Transistor stacking, Multiple threshold (MTCMOS), Dynamic threshold, Dual threshold, Variable threshold (VTCMOS), Pin-reordering, Supply voltage scaling & stacking techniques.
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