毫米波波段铜柱有效电导率及后壁波导传输损耗的评价

The 2011 International Conference on Advanced Technologies for Communications (ATC 2011) Pub Date : 2011-09-26 DOI:10.1109/ATC.2011.6027463

T. Tran, J. Hirokawa

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引用次数: 1

摘要

本文提出了一种在毫米波范围内测定覆铜介质衬底中铜柱有效电导率σp的方法。在直径为10 - 30波长的后壁圆形谐振器中激发的一些低语廊模式的谐振频率和卸载Q值间接评估了电导率。我们在40 ~ 51 GHz频段测量σp。铜柱的实测σp随频率的增加而减小。通过对后壁波导传输损耗的计算结果与实测结果的比较，验证了测量结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Evaluation of effective conductivity of copper post and transmission losses of post-wall waveguide in millimeter wave band

This paper presents a measurement method for determining the effective conductivity σp of copper posts in a copper-clad dielectric substrate in the millimeter-wave region. The conductivity is indirectly evaluated from measured resonant frequencies and unloaded Q values of a number of Whispering Gallery modes excited in a post-wall circular resonator with a large diameter of 10 – 30 wavelengths. We measure σp in 40 – 51 GHz band. The measured σp of the copper post decreases with the increase in the frequency. We confirm the measured results by comparing between the calculated results and the measured results of transmission losses for post-wall waveguides.

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The 2011 International Conference on Advanced Technologies for Communications (ATC 2011)

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