局部化学纳米诊断中原子力显微镜探针漂移的建模

2016 5th Mediterranean Conference on Embedded Computing (MECO) Pub Date : 2016-06-12 DOI:10.1109/MECO.2016.7525709

N. Tolkach, N. Vishnyakov, Y. Vorobyov, Aleksei Maslov

{"title":"局部化学纳米诊断中原子力显微镜探针漂移的建模","authors":"N. Tolkach, N. Vishnyakov, Y. Vorobyov, Aleksei Maslov","doi":"10.1109/MECO.2016.7525709","DOIUrl":null,"url":null,"abstract":"The article deals with the problem of drift of atomic-force microscope probe in local analysis of the molecular-chemical composition of structures with nanometer resolution. The method of mathematical modeling of image distortion due to drift and its application for a correction of movement trajectory of atomic-force microscope probe are shown.","PeriodicalId":253666,"journal":{"name":"2016 5th Mediterranean Conference on Embedded Computing (MECO)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling of the drift of atomic-force microscope probe for local chemical nanodiagnostics\",\"authors\":\"N. Tolkach, N. Vishnyakov, Y. Vorobyov, Aleksei Maslov\",\"doi\":\"10.1109/MECO.2016.7525709\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The article deals with the problem of drift of atomic-force microscope probe in local analysis of the molecular-chemical composition of structures with nanometer resolution. The method of mathematical modeling of image distortion due to drift and its application for a correction of movement trajectory of atomic-force microscope probe are shown.\",\"PeriodicalId\":253666,\"journal\":{\"name\":\"2016 5th Mediterranean Conference on Embedded Computing (MECO)\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 5th Mediterranean Conference on Embedded Computing (MECO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MECO.2016.7525709\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 5th Mediterranean Conference on Embedded Computing (MECO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MECO.2016.7525709","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文讨论了原子力显微镜探针在纳米分辨率结构分子化学组成局部分析中的漂移问题。介绍了漂移引起的图像畸变的数学建模方法及其在原子力显微镜探针运动轨迹修正中的应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Modeling of the drift of atomic-force microscope probe for local chemical nanodiagnostics

The article deals with the problem of drift of atomic-force microscope probe in local analysis of the molecular-chemical composition of structures with nanometer resolution. The method of mathematical modeling of image distortion due to drift and its application for a correction of movement trajectory of atomic-force microscope probe are shown.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2016 5th Mediterranean Conference on Embedded Computing (MECO)

自引率

0.00%

发文量