{"title":"基于Logistic测试覆盖函数的软件可靠性建模","authors":"Haifeng Li, Qiuying Li, Minyan Lu","doi":"10.1109/ISSRE.2008.51","DOIUrl":null,"url":null,"abstract":"Test coverage is a good indicator for testing completeness and effectiveness. This paper utilizes the logistic function to describe the test coverage growth behavior. Based on the logistic test coverage function, a model that relates test coverage to fault detection is presented and fitted to one actual data set. The experimental results show that, compared with three existing models, the evaluation performance of this new model is the best at least with the experimental data. Finally, the logistic test coverage function is applied to the NHPP software reliability modeling for further research.","PeriodicalId":448275,"journal":{"name":"2008 19th International Symposium on Software Reliability Engineering (ISSRE)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Software Reliability Modeling with Logistic Test Coverage Function\",\"authors\":\"Haifeng Li, Qiuying Li, Minyan Lu\",\"doi\":\"10.1109/ISSRE.2008.51\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Test coverage is a good indicator for testing completeness and effectiveness. This paper utilizes the logistic function to describe the test coverage growth behavior. Based on the logistic test coverage function, a model that relates test coverage to fault detection is presented and fitted to one actual data set. The experimental results show that, compared with three existing models, the evaluation performance of this new model is the best at least with the experimental data. Finally, the logistic test coverage function is applied to the NHPP software reliability modeling for further research.\",\"PeriodicalId\":448275,\"journal\":{\"name\":\"2008 19th International Symposium on Software Reliability Engineering (ISSRE)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 19th International Symposium on Software Reliability Engineering (ISSRE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSRE.2008.51\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 19th International Symposium on Software Reliability Engineering (ISSRE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.2008.51","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Software Reliability Modeling with Logistic Test Coverage Function
Test coverage is a good indicator for testing completeness and effectiveness. This paper utilizes the logistic function to describe the test coverage growth behavior. Based on the logistic test coverage function, a model that relates test coverage to fault detection is presented and fitted to one actual data set. The experimental results show that, compared with three existing models, the evaluation performance of this new model is the best at least with the experimental data. Finally, the logistic test coverage function is applied to the NHPP software reliability modeling for further research.