深x射线光刻(D2XRL)双曝光技术三维形状预测方法

N. Matsuzuka, Y. Hirai, O. Tabata
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引用次数: 4

摘要

本文介绍了一种利用深x射线光刻(D2XRL)中双重曝光技术预测被加工结构形状的分析方法。首先,提出了用简单方程高效计算加工形状的概念;其次,用新方法对组成简单方程的重要函数,即吸收剂量作为深度的函数和溶出速率作为吸收剂量的函数进行了高精度的实验测定。最后,用解析法对加工后的形状进行了预测。将预测结果与实验结果进行了比较,证实了加工后的形状预测具有可接受的精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Prediction Method of 3-D Shape Fabricated by Double Exposure Technique in Deep X-Ray Lithography (D2XRL)
This article describes an analytical method of predicting a processed structural shape by a double exposure technique in deep X-ray lithography (D2XRL). Firstly, the concept of calculating the processed shape efficiently by simple equations was considered. Secondly, important functions composing the simple equations, i.e., absorbed dose as a function of depth and dissolution rate as a function of absorbed dose, were experimentally determined with high accuracy by a newly proposed method. Lastly, the processed shape was predicted by the analytical method. By comparing the predicted result with the experimental one under the same condition, we confirmed that the processed shape was predicted with acceptable accuracy.
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