阀控铅酸蓄电池的加速寿命试验和热效应

R. Nelson
{"title":"阀控铅酸蓄电池的加速寿命试验和热效应","authors":"R. Nelson","doi":"10.1109/INTLEC.1989.88291","DOIUrl":null,"url":null,"abstract":"Elevated-temperature data and test methods are presented for Gates products commonly used in telecommunications applications. Failure modes are enumerated and life projections based on these tests are presented and evaluated; where possible, comparisons are made with actual product field failure results and it is found that substantial discrepancies exist. Temperature factors in both laboratory testing and field conditions are discussed and simulations of temperature effects in above-ground cabinets show that life projections based on average daily temperatures may be overly optimistic. It is shown that temperature and cell chemistry can have a dramatic impact on product life at elevated temperatures. Accelerated-life tests at 60-80 degrees C show that Gates products will meet or exceed that published float life of 8-12 years at 23 degrees C. Thermal effects in telecommunication applications are such that the interior of the battery will always be hotter than the surrounding environment by some factor, the latter having a profound impact upon battery life.<<ETX>>","PeriodicalId":272740,"journal":{"name":"Conference Proceedings., Eleventh International Telecommunications Energy Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Accelerated-life testing and thermal effects in valve-regulated lead-acid batteries\",\"authors\":\"R. Nelson\",\"doi\":\"10.1109/INTLEC.1989.88291\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Elevated-temperature data and test methods are presented for Gates products commonly used in telecommunications applications. Failure modes are enumerated and life projections based on these tests are presented and evaluated; where possible, comparisons are made with actual product field failure results and it is found that substantial discrepancies exist. Temperature factors in both laboratory testing and field conditions are discussed and simulations of temperature effects in above-ground cabinets show that life projections based on average daily temperatures may be overly optimistic. It is shown that temperature and cell chemistry can have a dramatic impact on product life at elevated temperatures. Accelerated-life tests at 60-80 degrees C show that Gates products will meet or exceed that published float life of 8-12 years at 23 degrees C. Thermal effects in telecommunication applications are such that the interior of the battery will always be hotter than the surrounding environment by some factor, the latter having a profound impact upon battery life.<<ETX>>\",\"PeriodicalId\":272740,\"journal\":{\"name\":\"Conference Proceedings., Eleventh International Telecommunications Energy Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-10-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Proceedings., Eleventh International Telecommunications Energy Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INTLEC.1989.88291\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings., Eleventh International Telecommunications Energy Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTLEC.1989.88291","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

介绍了电信应用中常用的盖茨产品的高温数据和测试方法。列举了失效模式,提出了基于这些试验的寿命预测并进行了评估;在可能的情况下,与实际产品现场失效结果进行比较,发现存在实质性差异。讨论了实验室测试和现场条件下的温度因素,对地上机柜温度影响的模拟表明,基于平均日温度的寿命预测可能过于乐观。研究表明,温度和细胞化学可以对高温下的产品寿命产生巨大影响。60-80摄氏度的加速寿命测试表明,盖茨产品在23摄氏度下将达到或超过公布的8-12年浮子寿命。电信应用中的热效应是,由于某些因素,电池内部总是比周围环境更热,后者对电池寿命有深远的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Accelerated-life testing and thermal effects in valve-regulated lead-acid batteries
Elevated-temperature data and test methods are presented for Gates products commonly used in telecommunications applications. Failure modes are enumerated and life projections based on these tests are presented and evaluated; where possible, comparisons are made with actual product field failure results and it is found that substantial discrepancies exist. Temperature factors in both laboratory testing and field conditions are discussed and simulations of temperature effects in above-ground cabinets show that life projections based on average daily temperatures may be overly optimistic. It is shown that temperature and cell chemistry can have a dramatic impact on product life at elevated temperatures. Accelerated-life tests at 60-80 degrees C show that Gates products will meet or exceed that published float life of 8-12 years at 23 degrees C. Thermal effects in telecommunication applications are such that the interior of the battery will always be hotter than the surrounding environment by some factor, the latter having a profound impact upon battery life.<>
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