{"title":"电介质板剥离的微波测试","authors":"V. R. Dzhala, L. I. Kapko","doi":"10.1109/DIPED.2009.5307269","DOIUrl":null,"url":null,"abstract":"A method of microwave non-destructive testing of exfoliation in a dielectric plate is developed. The proposed method is based on multi-frequency sensing in 5-mm waveband and solving of the inverse problem to determine dielectric structure's thickness. Precision and resolution of the proposed method are evaluated.","PeriodicalId":404875,"journal":{"name":"2009 International Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microwave testing of exfoliation in a dielectric plate\",\"authors\":\"V. R. Dzhala, L. I. Kapko\",\"doi\":\"10.1109/DIPED.2009.5307269\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method of microwave non-destructive testing of exfoliation in a dielectric plate is developed. The proposed method is based on multi-frequency sensing in 5-mm waveband and solving of the inverse problem to determine dielectric structure's thickness. Precision and resolution of the proposed method are evaluated.\",\"PeriodicalId\":404875,\"journal\":{\"name\":\"2009 International Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-10-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DIPED.2009.5307269\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DIPED.2009.5307269","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microwave testing of exfoliation in a dielectric plate
A method of microwave non-destructive testing of exfoliation in a dielectric plate is developed. The proposed method is based on multi-frequency sensing in 5-mm waveband and solving of the inverse problem to determine dielectric structure's thickness. Precision and resolution of the proposed method are evaluated.