在晶体管级误路检测

Abhijit Das, Samrat Sen, Mohan Rangan, Rupesh Nayak, G. Nandakumar
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引用次数: 0

摘要

对静态时序分析的普遍关注是,它可能在电路中存在假路径时产生非常悲观的结果。因此,在时序分析中检测和避免假路径,以更好地估计设计的时序特性是至关重要的。本文提出了一个在晶体管级自动检测误路的框架。假路径检测包括从晶体管级网表中提取逻辑,然后检测假路径,更准确地估计路径延迟。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
False path detection at transistor level
The prevalent concern over static timing analysis is that it might produce a very pessimistic result in presence of false paths in the circuit. It is therefore essential to detect and avoid the false paths during timing analysis, to estimate the timing characteristics of the design better. In this paper a framework is presented to automatically detect false paths at the transistor level. The false path detection involves logic extraction from a transistor level netlist and then detecting false paths, with more accurate estimation of the path delays.
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