Intersil的总剂量和单事件效应试验结果ISL7×814SEH大电流驱动器

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745726

W. H. Newman, N. V. van Vonno, A. Robinson, S. D. Turner, L. Pearce, E. Thomson

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引用次数: 0

摘要

我们报告了Intersil ISL72814SEH和ISL73814SEH辐射硬化、高压、大电流驱动电路的总电离剂量(TID)和破坏性和非破坏性单事件效应(SEE)测试结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Total Dose and Single-Event Effects Test Results of the Intersil ISL7×814SEH High Current Driver

We report the results of total ionizing dose (TID) and destructive and nondestructive single-event effects (SEE) testing of the Intersil ISL72814SEH and ISL73814SEH radiation hardened, high-voltage, high-current, driver circuits.

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来源期刊

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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