{"title":"RFID标签极低压电荷泵的设计与分析","authors":"S. Amini, C. Plett","doi":"10.1109/MNRC.2008.4683365","DOIUrl":null,"url":null,"abstract":"The design and analysis of very low-voltage driven charge pumps powered by RF telemetry is proposed. The use of thick oxide zero threshold voltage transistors along with appropriately sized boosting capacitors and matching techniques allows for charge pumps capable of achieving high voltage DC outputs with very low input voltages. Two test chips have been fabricated, an 11 stage pump and a 12 stage pump in 1.2 V 0.13-mum standard CMOS process. The pumps are capable of generating an output voltage above 1.2 volts with input voltages below 100 mV making them ideal for generating DC supplies from low RF scavenged sources.","PeriodicalId":247684,"journal":{"name":"2008 1st Microsystems and Nanoelectronics Research Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Design and analysis of very low voltage charge pumps for RFID tags\",\"authors\":\"S. Amini, C. Plett\",\"doi\":\"10.1109/MNRC.2008.4683365\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The design and analysis of very low-voltage driven charge pumps powered by RF telemetry is proposed. The use of thick oxide zero threshold voltage transistors along with appropriately sized boosting capacitors and matching techniques allows for charge pumps capable of achieving high voltage DC outputs with very low input voltages. Two test chips have been fabricated, an 11 stage pump and a 12 stage pump in 1.2 V 0.13-mum standard CMOS process. The pumps are capable of generating an output voltage above 1.2 volts with input voltages below 100 mV making them ideal for generating DC supplies from low RF scavenged sources.\",\"PeriodicalId\":247684,\"journal\":{\"name\":\"2008 1st Microsystems and Nanoelectronics Research Conference\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 1st Microsystems and Nanoelectronics Research Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MNRC.2008.4683365\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 1st Microsystems and Nanoelectronics Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MNRC.2008.4683365","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
摘要
提出了一种基于射频遥测技术的极低压驱动电荷泵的设计与分析。使用厚氧化物零阈值电压晶体管以及适当尺寸的升压电容器和匹配技术,可以使电荷泵能够以非常低的输入电压实现高压直流输出。两个测试芯片,一个11级泵和一个12级泵在1.2 V 0.13妈标准CMOS工艺。该泵能够产生1.2伏以上的输出电压,输入电压低于100毫伏,使其成为从低射频清除源产生直流电源的理想选择。
Design and analysis of very low voltage charge pumps for RFID tags
The design and analysis of very low-voltage driven charge pumps powered by RF telemetry is proposed. The use of thick oxide zero threshold voltage transistors along with appropriately sized boosting capacitors and matching techniques allows for charge pumps capable of achieving high voltage DC outputs with very low input voltages. Two test chips have been fabricated, an 11 stage pump and a 12 stage pump in 1.2 V 0.13-mum standard CMOS process. The pumps are capable of generating an output voltage above 1.2 volts with input voltages below 100 mV making them ideal for generating DC supplies from low RF scavenged sources.