磁通密度作为电触点状态的探测

A. Nordstrom, R. Gustafsson
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引用次数: 2

摘要

开发了一种新的电触点远程测量技术,并在实验室进行了试验。通过测量电触点外磁通密度的变化,可以探测触点区域内的电流分布。在接触界面上,电流被限制在有限数量的接触点,即a点。如果电触点条件良好,则在接触界面上均匀分布大量的a点。随着接触的退化,接触点的数量减少,从统计上讲,接触界面上a点的分布将更加不均匀。实验室试验清楚地表明,在接触点分布不均匀的接触界面附近,电流分布是不均匀的。在距离接触界面35毫米的距离内,不均匀性已被解决。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Magnetic flux density as a probe of the state of electrical contacts
A new remote measuring technique for electrical contacts has been developed and tested in laboratory experiments. By measuring variations in the magnetic flux density outside an electrical contact, the current distribution in the contact region can be probed. At the contact interface the current is constricted to a limited number of contact spots, a-spots. If the condition of an electrical contact is good, a large number of a-spots are evenly distributed over the contact interface. As the contact degrades the number of contact spots decreases and statistically the distribution of a-spots over the contact interface will be more inhomogeneous. The laboratory tests clearly show how an inhomogeneous current distribution develops in the vicinity of a contact interface where the contact spots are unevenly distributed. The inhomogeneities have been resolved up to a distance of 35 mm away from the contact interface.
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