短宽SiC脉冲对匝匝绝缘局部放电起始电压的影响

A. Rumi, A. Cavallini
{"title":"短宽SiC脉冲对匝匝绝缘局部放电起始电压的影响","authors":"A. Rumi, A. Cavallini","doi":"10.1109/CEIDP55452.2022.9985315","DOIUrl":null,"url":null,"abstract":"Short-width voltage waveforms, here as short as one microsecond, are good approximation of the turn-turn electrical stresses in machine fed by converters with very short rise times. This study shows that partial discharge inception voltage of turn-turn models under such circumstances is higher than the one for longer pulses, possibly challenging the idea that the extremely short rise times are always correspondent to worse inception conditions for the insulation.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Influence of Short-Width SiC Pulses on the Partial Discharge Inception Voltage of Turn-Turn Insulation\",\"authors\":\"A. Rumi, A. Cavallini\",\"doi\":\"10.1109/CEIDP55452.2022.9985315\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Short-width voltage waveforms, here as short as one microsecond, are good approximation of the turn-turn electrical stresses in machine fed by converters with very short rise times. This study shows that partial discharge inception voltage of turn-turn models under such circumstances is higher than the one for longer pulses, possibly challenging the idea that the extremely short rise times are always correspondent to worse inception conditions for the insulation.\",\"PeriodicalId\":374945,\"journal\":{\"name\":\"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP55452.2022.9985315\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP55452.2022.9985315","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

短宽度的电压波形,在这里短至一微秒,是很好的近似在极短的上升时间内由变换器供给的机器中的匝匝电应力。这项研究表明,在这种情况下,匝匝模型的局部放电起始电压高于长脉冲的起始电压,这可能挑战了极短的上升时间总是对应于绝缘较差的起始条件的想法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Influence of Short-Width SiC Pulses on the Partial Discharge Inception Voltage of Turn-Turn Insulation
Short-width voltage waveforms, here as short as one microsecond, are good approximation of the turn-turn electrical stresses in machine fed by converters with very short rise times. This study shows that partial discharge inception voltage of turn-turn models under such circumstances is higher than the one for longer pulses, possibly challenging the idea that the extremely short rise times are always correspondent to worse inception conditions for the insulation.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信