垂直变化掺杂的1.2kV半超结FRD设计与仿真

Yuefeng Wu, Yu Wu, Xintian Zhou, Feng Liu, Lei Zong
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引用次数: 0

摘要

提出了一种1200V垂直可变掺杂半超结快速恢复二极管(VVD-Semi-SJ-FRD)。在超结结构中,需要p柱和漂移区来维持电荷平衡。因此,半超结快速恢复二极管的反向击穿电压对p柱掺杂浓度非常敏感,导致p柱离子注入的工艺窗口较窄。本文提出的结构采用三层外延层,靠近p型区侧面的外延层和p柱下方的外延层为低掺杂层,中间为高掺杂层。通过分析p柱浓度对反击穿电压和不同浓度下电场分布的影响,表明所提出的结构可以有效降低反击穿电压对p柱掺杂浓度的敏感性,从而扩大p柱离子注入的过程窗口。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and Simulation of 1.2kV Semi-Super Junction FRD with Vertical Variation Doping
A 1200V vertical variable doped semi-super junction fast recovery diode (VVD-Semi-SJ-FRD) is presented in this paper. In super junction structure, P-pillar and drift region are needed to maintain charge balance. As a result, the reverse breakdown voltage of the semi-super junction fast recovery diode is very sensitive to the doping concentration of P-pillar, resulting in a narrow process window for ion implantation of P-pillar. The structure proposed in this paper uses three epitaxial layers, the epitaxial layer near the side of the P-type region and the epitaxial layer below the P-pillar is low-doping, and the middle is high-doping. By analyzing the influence of P-pillar concentration on reverse breakdown voltage and the electric field distribution at different concentrations, it is shown that the proposed structure can effectively reduce the sensitivity of reverse breakdown voltage to P-pillar doping concentration, thus enlarges the process window of P-pillar ion implantation.
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