脑电与眼动追踪集成用于眼伪影校正

P. Lourenço, W. Abbott, A. Faisal
{"title":"脑电与眼动追踪集成用于眼伪影校正","authors":"P. Lourenço, W. Abbott, A. Faisal","doi":"10.5220/0005094600790086","DOIUrl":null,"url":null,"abstract":"Electroencephalograms (EEG) are a widely used brain signal recording technique. The information conveyed in these recordings can be an extremely useful tool in the diagnosis of some diseases and disturbances, as well as in the development of non-invasive Brain-Machine Interfaces (BMI). However, the non-invasive electrical recording setup comes with two major downsides, a. poor signal-to-noise ratio and b. the vulnerability to any external and internal noise sources. One of the main sources of artefacts are eye movements due to the electric dipole between the cornea and the retina. We have previously proposed that monitoring eye-movements provide a complementary signal for BMIs. He we propose a novel technique to remove eye-related artefacts from the EEG recordings. We couple Eye Tracking with EEG allowing us to independently measure when ocular artefact events occur and thus clean them up in a targeted manner instead of using a “blind” artefact clean up correction technique. Three standard methods of artefact correction were applied in an event-driven, supervised manner: 1. Independent Components Analysis (ICA), 2. Wiener Filter and 3. Wavelet Decomposition and compared to “blind” unsupervised ICA clean up. These are standard artefact correction approaches implemented in many toolboxes and experimental EEG systems and could easily be applied by their users in an event-driven manner. Already the qualitative inspection of the clean up traces show that the simple targeted artefact event-driven clean up outperforms the traditional “blind” clean up approaches. We conclude that this justifies the small extra effort of performing simultaneous eye tracking with any EEG recording to enable simple, but targeted, automatic artefact removal that preserves more of the original signal.","PeriodicalId":167011,"journal":{"name":"International Congress on Neurotechnology, Electronics and Informatics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"EEG and Eye-Tracking Integration for Ocular Artefact Correction\",\"authors\":\"P. Lourenço, W. Abbott, A. Faisal\",\"doi\":\"10.5220/0005094600790086\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electroencephalograms (EEG) are a widely used brain signal recording technique. The information conveyed in these recordings can be an extremely useful tool in the diagnosis of some diseases and disturbances, as well as in the development of non-invasive Brain-Machine Interfaces (BMI). However, the non-invasive electrical recording setup comes with two major downsides, a. poor signal-to-noise ratio and b. the vulnerability to any external and internal noise sources. One of the main sources of artefacts are eye movements due to the electric dipole between the cornea and the retina. We have previously proposed that monitoring eye-movements provide a complementary signal for BMIs. He we propose a novel technique to remove eye-related artefacts from the EEG recordings. We couple Eye Tracking with EEG allowing us to independently measure when ocular artefact events occur and thus clean them up in a targeted manner instead of using a “blind” artefact clean up correction technique. Three standard methods of artefact correction were applied in an event-driven, supervised manner: 1. Independent Components Analysis (ICA), 2. Wiener Filter and 3. Wavelet Decomposition and compared to “blind” unsupervised ICA clean up. These are standard artefact correction approaches implemented in many toolboxes and experimental EEG systems and could easily be applied by their users in an event-driven manner. Already the qualitative inspection of the clean up traces show that the simple targeted artefact event-driven clean up outperforms the traditional “blind” clean up approaches. We conclude that this justifies the small extra effort of performing simultaneous eye tracking with any EEG recording to enable simple, but targeted, automatic artefact removal that preserves more of the original signal.\",\"PeriodicalId\":167011,\"journal\":{\"name\":\"International Congress on Neurotechnology, Electronics and Informatics\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Congress on Neurotechnology, Electronics and Informatics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5220/0005094600790086\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Congress on Neurotechnology, Electronics and Informatics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5220/0005094600790086","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

脑电图(EEG)是一种应用广泛的脑信号记录技术。这些记录所传达的信息可以成为诊断某些疾病和干扰以及开发非侵入性脑机接口(BMI)的非常有用的工具。然而,非侵入性电记录装置有两个主要缺点,一是信噪比差,二是容易受到任何外部和内部噪声源的影响。伪影的主要来源之一是由于角膜和视网膜之间的电偶极子引起的眼球运动。我们之前曾提出监测眼动为bmi提供补充信号。他提出了一种从脑电图记录中去除眼睛相关伪影的新技术。我们将眼动追踪与脑电图相结合,使我们能够独立测量眼部伪影事件发生的时间,从而以有针对性的方式清除它们,而不是使用“盲目”伪影清除校正技术。以事件驱动、监督的方式应用了三种标准的伪影校正方法:独立成分分析(ICA);维纳过滤器和3。并将小波分解与“盲”无监督ICA进行比较清理。这些都是在许多工具箱和实验性EEG系统中实现的标准伪影校正方法,并且可以很容易地被用户以事件驱动的方式应用。对清理痕迹的定性检查已经表明,简单的目标工件事件驱动的清理优于传统的“盲”清理方法。我们的结论是,这证明了在任何脑电图记录中同时进行眼动追踪的小额外努力是合理的,以实现简单但有针对性的自动去除伪影,从而保留更多的原始信号。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
EEG and Eye-Tracking Integration for Ocular Artefact Correction
Electroencephalograms (EEG) are a widely used brain signal recording technique. The information conveyed in these recordings can be an extremely useful tool in the diagnosis of some diseases and disturbances, as well as in the development of non-invasive Brain-Machine Interfaces (BMI). However, the non-invasive electrical recording setup comes with two major downsides, a. poor signal-to-noise ratio and b. the vulnerability to any external and internal noise sources. One of the main sources of artefacts are eye movements due to the electric dipole between the cornea and the retina. We have previously proposed that monitoring eye-movements provide a complementary signal for BMIs. He we propose a novel technique to remove eye-related artefacts from the EEG recordings. We couple Eye Tracking with EEG allowing us to independently measure when ocular artefact events occur and thus clean them up in a targeted manner instead of using a “blind” artefact clean up correction technique. Three standard methods of artefact correction were applied in an event-driven, supervised manner: 1. Independent Components Analysis (ICA), 2. Wiener Filter and 3. Wavelet Decomposition and compared to “blind” unsupervised ICA clean up. These are standard artefact correction approaches implemented in many toolboxes and experimental EEG systems and could easily be applied by their users in an event-driven manner. Already the qualitative inspection of the clean up traces show that the simple targeted artefact event-driven clean up outperforms the traditional “blind” clean up approaches. We conclude that this justifies the small extra effort of performing simultaneous eye tracking with any EEG recording to enable simple, but targeted, automatic artefact removal that preserves more of the original signal.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信