数字集成电路在电磁辐射影响下的失效

11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487) Pub Date : 2001-09-10 DOI:10.1109/CRMICO.2001.961662

K.B. Vasiliev, A. Klyuchnik, A. V. Solodov

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引用次数: 0

摘要

给出了短脉冲电磁辐射下数字集成电路失效的实验数据。集成电路损伤能量是电磁脉冲持续时间和重复频率的函数。在厘米波段和毫米波波段进行了实验。

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Failure of digital IC under the influence of electromagnetic radiation

The experimental data of digital IC failure under the influence of short pulse electromagnetic irradiation are presented. The energy of IC damage is determined as a function of electromagnetic pulse duration and repetition rate. Experiments have been performed in centimeter and millimeter wave band.

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11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487)

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