{"title":"一种带约束的T-Way检验序列生成方法","authors":"Feng Duan, Yu Lei, R. Kacker, D. R. Kuhn","doi":"10.1109/ICSTW.2019.00059","DOIUrl":null,"url":null,"abstract":"In this paper we address the problem of constraint handling in t-way test sequence generation. We develop a notation for specifying sequencing constraints and present a t-way test sequence generation that handles the constraints specified in this notation. We report a case study in which we applied our notation and test generation algorithm to a real-life communication protocol. Our experience indicates that our notation is intuitive to use and allows us to express important sequencing constraints for the protocol. However, the test generation algorithm takes a significant amount of time. This work is part of our larger effort to make t-way sequence testing practically useful.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"An Approach to T-Way Test Sequence Generation With Constraints\",\"authors\":\"Feng Duan, Yu Lei, R. Kacker, D. R. Kuhn\",\"doi\":\"10.1109/ICSTW.2019.00059\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we address the problem of constraint handling in t-way test sequence generation. We develop a notation for specifying sequencing constraints and present a t-way test sequence generation that handles the constraints specified in this notation. We report a case study in which we applied our notation and test generation algorithm to a real-life communication protocol. Our experience indicates that our notation is intuitive to use and allows us to express important sequencing constraints for the protocol. However, the test generation algorithm takes a significant amount of time. This work is part of our larger effort to make t-way sequence testing practically useful.\",\"PeriodicalId\":310230,\"journal\":{\"name\":\"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSTW.2019.00059\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSTW.2019.00059","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Approach to T-Way Test Sequence Generation With Constraints
In this paper we address the problem of constraint handling in t-way test sequence generation. We develop a notation for specifying sequencing constraints and present a t-way test sequence generation that handles the constraints specified in this notation. We report a case study in which we applied our notation and test generation algorithm to a real-life communication protocol. Our experience indicates that our notation is intuitive to use and allows us to express important sequencing constraints for the protocol. However, the test generation algorithm takes a significant amount of time. This work is part of our larger effort to make t-way sequence testing practically useful.