ICEM:集成电路电磁兼容新标准的定义和实例

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI:10.1109/ISEMC.2003.1236727

C. Lochot, J. Levant

{"title":"ICEM:集成电路电磁兼容新标准的定义和实例","authors":"C. Lochot, J. Levant","doi":"10.1109/ISEMC.2003.1236727","DOIUrl":null,"url":null,"abstract":"The ICEM standard (Integrated Circuit Electromagnetic Model) was proposed by the French standard committee (UTE) where many semi-conductor manufacturers and final users are involved. The ICEM standard proposal is nowadays registered as a Technical Report (IEC62014-3). In the first part of this paper, the authors will present the architecture of the model. In the second part, they will describe different methods to characterize the parameters of the model. Finally, comparisons between measurement and simulation results highlight the capability of this approach for the prediction of the electromagnetic emission of an IC.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"29","resultStr":"{\"title\":\"ICEM: a new standard for EMC of IC definition and examples\",\"authors\":\"C. Lochot, J. Levant\",\"doi\":\"10.1109/ISEMC.2003.1236727\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The ICEM standard (Integrated Circuit Electromagnetic Model) was proposed by the French standard committee (UTE) where many semi-conductor manufacturers and final users are involved. The ICEM standard proposal is nowadays registered as a Technical Report (IEC62014-3). In the first part of this paper, the authors will present the architecture of the model. In the second part, they will describe different methods to characterize the parameters of the model. Finally, comparisons between measurement and simulation results highlight the capability of this approach for the prediction of the electromagnetic emission of an IC.\",\"PeriodicalId\":359422,\"journal\":{\"name\":\"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"29\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2003.1236727\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2003.1236727","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 29

摘要

ICEM标准(Integrated Circuit Electromagnetic Model，集成电路电磁模型)是由法国标准委员会(UTE)提出的，涉及许多半导体制造商和最终用户。ICEM标准提案目前已注册为技术报告(IEC62014-3)。在本文的第一部分，作者将介绍该模型的体系结构。在第二部分，他们将描述不同的方法来表征模型的参数。最后，通过对测量结果和仿真结果的比较，突出了该方法预测集成电路电磁发射的能力。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

ICEM: a new standard for EMC of IC definition and examples

The ICEM standard (Integrated Circuit Electromagnetic Model) was proposed by the French standard committee (UTE) where many semi-conductor manufacturers and final users are involved. The ICEM standard proposal is nowadays registered as a Technical Report (IEC62014-3). In the first part of this paper, the authors will present the architecture of the model. In the second part, they will describe different methods to characterize the parameters of the model. Finally, comparisons between measurement and simulation results highlight the capability of this approach for the prediction of the electromagnetic emission of an IC.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)

自引率

0.00%

发文量