非制冷红外传感器的多模拟总线非均匀性校正方案

2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408) Pub Date : 2003-06-12 DOI:10.1109/VLSIC.2003.1221189

Akio Tanaka, Y. Tanaka, T. Endoh, K. Okuyama, K. Kawano

{"title":"非制冷红外传感器的多模拟总线非均匀性校正方案","authors":"Akio Tanaka, Y. Tanaka, T. Endoh, K. Okuyama, K. Kawano","doi":"10.1109/VLSIC.2003.1221189","DOIUrl":null,"url":null,"abstract":"We propose a non-uniformity correction scheme that employs analog buses connecting readout channels to correct the variation of the bias current in uncooled infrared detectors prior to amplification. One analog voltage is selected from an analog bus to adjust the bias voltage of the detectors. We have fabricated 320/spl times/240-pixels sensor with 160 readout channels by using two 16-level analog buses. The variation in the bias current for this sensor decreased to 1/38 (5.2-bit), which helps to improve the sensor's temperature stability. An application of this approach in a flush ADC is also discussed.","PeriodicalId":270304,"journal":{"name":"2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A non-uniformity correction scheme using multiple analog buses for an uncooled infrared sensor\",\"authors\":\"Akio Tanaka, Y. Tanaka, T. Endoh, K. Okuyama, K. Kawano\",\"doi\":\"10.1109/VLSIC.2003.1221189\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a non-uniformity correction scheme that employs analog buses connecting readout channels to correct the variation of the bias current in uncooled infrared detectors prior to amplification. One analog voltage is selected from an analog bus to adjust the bias voltage of the detectors. We have fabricated 320/spl times/240-pixels sensor with 160 readout channels by using two 16-level analog buses. The variation in the bias current for this sensor decreased to 1/38 (5.2-bit), which helps to improve the sensor's temperature stability. An application of this approach in a flush ADC is also discussed.\",\"PeriodicalId\":270304,\"journal\":{\"name\":\"2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2003.1221189\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2003.1221189","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 8

摘要

我们提出了一种非均匀性校正方案，利用模拟总线连接读出通道来校正非冷却红外探测器放大前的偏置电流变化。从模拟总线中选择一个模拟电压来调节探测器的偏置电压。通过使用两个16级模拟总线，我们制造了具有160个读出通道的320/spl次/240像素传感器。该传感器的偏置电流变化减小到1/38(5.2位)，有助于提高传感器的温度稳定性。文中还讨论了该方法在同花顺ADC中的应用。

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A non-uniformity correction scheme using multiple analog buses for an uncooled infrared sensor

We propose a non-uniformity correction scheme that employs analog buses connecting readout channels to correct the variation of the bias current in uncooled infrared detectors prior to amplification. One analog voltage is selected from an analog bus to adjust the bias voltage of the detectors. We have fabricated 320/spl times/240-pixels sensor with 160 readout channels by using two 16-level analog buses. The variation in the bias current for this sensor decreased to 1/38 (5.2-bit), which helps to improve the sensor's temperature stability. An application of this approach in a flush ADC is also discussed.

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2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)

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