G. Ayzenshtat, M. Lelekov, O. Tolbanov, L. G. Shapoval
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The Undestroying Quality Monitoring Method for the GaAs Detector Structures
We propose a new undestroying quality monitoring method for the GaAs detector structures that allows to define the charge collection efficiency. Measured life time of nonequilibrium electrons and holes is 15 and 3.3 ns, respectively.