通过镜子观察磁铁线:用光学显微镜解决问题

[1991] Proceedings of the 20th Electrical Electronics Insulation Conference Pub Date : 1900-01-01 DOI:10.1109/EEIC.1991.162589

D. Myers

{"title":"通过镜子观察磁铁线:用光学显微镜解决问题","authors":"D. Myers","doi":"10.1109/EEIC.1991.162589","DOIUrl":null,"url":null,"abstract":"Problem solving associated with the manufacture and application of magnet wire, using microscopic analysis, is discussed in depth. Techniques such as simple stereoscopic magnification (to locate microscopic winding damage), polarized light (for fiber identification and stress analysis), and cross-sectional image analysis are shown in case study form.<<ETX>>","PeriodicalId":367238,"journal":{"name":"[1991] Proceedings of the 20th Electrical Electronics Insulation Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Magnet wire viewed through a looking glass: problem solving with the optical microscope\",\"authors\":\"D. Myers\",\"doi\":\"10.1109/EEIC.1991.162589\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Problem solving associated with the manufacture and application of magnet wire, using microscopic analysis, is discussed in depth. Techniques such as simple stereoscopic magnification (to locate microscopic winding damage), polarized light (for fiber identification and stress analysis), and cross-sectional image analysis are shown in case study form.<<ETX>>\",\"PeriodicalId\":367238,\"journal\":{\"name\":\"[1991] Proceedings of the 20th Electrical Electronics Insulation Conference\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Proceedings of the 20th Electrical Electronics Insulation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EEIC.1991.162589\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings of the 20th Electrical Electronics Insulation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEIC.1991.162589","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

利用显微分析方法，深入探讨了磁丝制造和应用中存在的问题。简单的立体放大(定位微观缠绕损伤)、偏振光(用于纤维识别和应力分析)和截面图像分析等技术以案例研究的形式展示。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Magnet wire viewed through a looking glass: problem solving with the optical microscope

Problem solving associated with the manufacture and application of magnet wire, using microscopic analysis, is discussed in depth. Techniques such as simple stereoscopic magnification (to locate microscopic winding damage), polarized light (for fiber identification and stress analysis), and cross-sectional image analysis are shown in case study form.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

[1991] Proceedings of the 20th Electrical Electronics Insulation Conference

自引率

0.00%

发文量