功率谱估计中波动信号的子带分解

J. Zajacek, L. Grmela
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摘要

噪声光谱用于半导体材料的质量和可靠性的测定。我们采用时频分析的方法处理长时间持续时间的随机信号。采用递归的方式实现了倍频分频带的树结构FIR滤波器组,并将其设计为功率谱密度估计的全并行计算算法。在甚低频区,我们将获得高分辨率和低水平方差的PSD。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Sub-Band decomposition of Fluctuated signals for the Estimation of Power Spectra
The noise spectroscopy is used to determinate quality and reliability of semiconductor materials. We have used the means of time-frequency analysis for processing of long time duration stochastic signal. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed as full parallel computational algorithm for power spectral density estimation. In the very low frequency area we will obtain high resolution and low level variance of PSD.
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