{"title":"模数转换器的校准和校正方法:最新进展","authors":"A. Korotkov","doi":"10.1109/ISSCS.2013.6651256","DOIUrl":null,"url":null,"abstract":"In this paper several calibration and correction methods for major class of analog-to-digital converters (ADC) are described, such as parallel (flash) ADCs, pipeline ADCs, successive approximation ADCs, delta-sigma ADCs. Various types of the methods have been developed, which have markedly improved the figure of merits by alleviating margins for device variations. The above methods not only overcome a circuit's weak points but also give the directions to develop new circuit and system topologies.","PeriodicalId":260263,"journal":{"name":"International Symposium on Signals, Circuits and Systems ISSCS2013","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Calibration and correction methods for analog-to-digital converters: State of the art\",\"authors\":\"A. Korotkov\",\"doi\":\"10.1109/ISSCS.2013.6651256\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper several calibration and correction methods for major class of analog-to-digital converters (ADC) are described, such as parallel (flash) ADCs, pipeline ADCs, successive approximation ADCs, delta-sigma ADCs. Various types of the methods have been developed, which have markedly improved the figure of merits by alleviating margins for device variations. The above methods not only overcome a circuit's weak points but also give the directions to develop new circuit and system topologies.\",\"PeriodicalId\":260263,\"journal\":{\"name\":\"International Symposium on Signals, Circuits and Systems ISSCS2013\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Symposium on Signals, Circuits and Systems ISSCS2013\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCS.2013.6651256\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Signals, Circuits and Systems ISSCS2013","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCS.2013.6651256","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Calibration and correction methods for analog-to-digital converters: State of the art
In this paper several calibration and correction methods for major class of analog-to-digital converters (ADC) are described, such as parallel (flash) ADCs, pipeline ADCs, successive approximation ADCs, delta-sigma ADCs. Various types of the methods have been developed, which have markedly improved the figure of merits by alleviating margins for device variations. The above methods not only overcome a circuit's weak points but also give the directions to develop new circuit and system topologies.
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