考虑门延迟影响的多攻击者串扰故障的基于ILP的ATPG技术

Kunal P. Ganeshpure, S. Kundu
{"title":"考虑门延迟影响的多攻击者串扰故障的基于ILP的ATPG技术","authors":"Kunal P. Ganeshpure, S. Kundu","doi":"10.1109/VLSI.Design.2009.10","DOIUrl":null,"url":null,"abstract":"Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays\",\"authors\":\"Kunal P. Ganeshpure, S. Kundu\",\"doi\":\"10.1109/VLSI.Design.2009.10\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.\",\"PeriodicalId\":267121,\"journal\":{\"name\":\"2009 22nd International Conference on VLSI Design\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-01-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 22nd International Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSI.Design.2009.10\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 22nd International Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI.Design.2009.10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

串扰故障已成为电路故障的重要机制。长信号网特别值得关注,因为它们往往具有较高的耦合电容与总电容比。一个典型的长网也有多个攻击者。在生成模式以在网络上产生最大的串扰噪声时,可能无法逻辑地或同时激活所有攻击者。因此,模式生成必须专注于激活攻击者的最大子集,或者大约在受害者网络切换的同时激活攻击者,同时将故障效应传播到主要输出。这是一个众所周知的问题。在本文中,我们提出了一种使用0-1整数线性规划(ILP)结合电路变换来模拟门延迟的解决方案。本文的一个主要贡献是将多路径故障传播建模为线性规划问题。该技术已应用于iscas85基准电路。结果表明,可以切换的总电容百分比在20-80%之间。该技术生成的模式对制造测试应用和信号完整性验证都很有用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.
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