{"title":"考虑门延迟影响的多攻击者串扰故障的基于ILP的ATPG技术","authors":"Kunal P. Ganeshpure, S. Kundu","doi":"10.1109/VLSI.Design.2009.10","DOIUrl":null,"url":null,"abstract":"Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays\",\"authors\":\"Kunal P. Ganeshpure, S. Kundu\",\"doi\":\"10.1109/VLSI.Design.2009.10\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.\",\"PeriodicalId\":267121,\"journal\":{\"name\":\"2009 22nd International Conference on VLSI Design\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-01-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 22nd International Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSI.Design.2009.10\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 22nd International Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI.Design.2009.10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.