{"title":"氮化镓功率晶体管行为建模","authors":"G. D. Capua, N. Femia","doi":"10.1109/SMACD58065.2023.10192135","DOIUrl":null,"url":null,"abstract":"This paper discusses the behavioral modeling of Gallium Nitride (GaN) power transistors for the analysis of voltage/current waveforms and losses in hard-switching Switch-Mode Power Supplies (SMPSs), with main emphasis on the I-V and C-V characteristics. A new technique extending the I–V characteristics to high drain-source voltage is presented. Two different capacitance models are also compared. The proposed models are fully based on device datasheet curves and have been implemented in PathWave Advanced Design System software, allowing easy construction of symbolically defined devices. A 350 V/3 A boost converter is considered as a case study, with a half-bridge of two 650 V-30 A GaN power transistors.","PeriodicalId":239306,"journal":{"name":"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"GaN Power Transistors Behavioral Modeling\",\"authors\":\"G. D. Capua, N. Femia\",\"doi\":\"10.1109/SMACD58065.2023.10192135\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the behavioral modeling of Gallium Nitride (GaN) power transistors for the analysis of voltage/current waveforms and losses in hard-switching Switch-Mode Power Supplies (SMPSs), with main emphasis on the I-V and C-V characteristics. A new technique extending the I–V characteristics to high drain-source voltage is presented. Two different capacitance models are also compared. The proposed models are fully based on device datasheet curves and have been implemented in PathWave Advanced Design System software, allowing easy construction of symbolically defined devices. A 350 V/3 A boost converter is considered as a case study, with a half-bridge of two 650 V-30 A GaN power transistors.\",\"PeriodicalId\":239306,\"journal\":{\"name\":\"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMACD58065.2023.10192135\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMACD58065.2023.10192135","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
本文讨论了氮化镓(GaN)功率晶体管的行为建模,用于分析硬开关开关电源(smps)中的电压/电流波形和损耗,主要侧重于I-V和C-V特性。提出了一种将I-V特性扩展到高漏源电压的新技术。两种不同的电容模型也进行了比较。所提出的模型完全基于设备数据表曲线,并已在PathWave高级设计系统软件中实现,允许轻松构建符号定义的设备。一个350 V/3 A升压变换器被认为是一个案例研究,具有两个650 V-30 A GaN功率晶体管的半桥。
This paper discusses the behavioral modeling of Gallium Nitride (GaN) power transistors for the analysis of voltage/current waveforms and losses in hard-switching Switch-Mode Power Supplies (SMPSs), with main emphasis on the I-V and C-V characteristics. A new technique extending the I–V characteristics to high drain-source voltage is presented. Two different capacitance models are also compared. The proposed models are fully based on device datasheet curves and have been implemented in PathWave Advanced Design System software, allowing easy construction of symbolically defined devices. A 350 V/3 A boost converter is considered as a case study, with a half-bridge of two 650 V-30 A GaN power transistors.