{"title":"高应力交流波形下金属化塑料薄膜电容器的可靠性考虑","authors":"R. A. Frantz","doi":"10.1109/PESC.1981.7083628","DOIUrl":null,"url":null,"abstract":"Power conversion circuits often apply AC waveforms to metallized plastic film capacitors whose characterization is largely based on DC testing. This paper describes failure mechanisms introduced by high-stress AC waveforms and ways of minimizing such failures.","PeriodicalId":165849,"journal":{"name":"1981 IEEE Power Electronics Specialists Conference","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reliability considerations for metallized plastic film capacitors under high-stress AC waveforms\",\"authors\":\"R. A. Frantz\",\"doi\":\"10.1109/PESC.1981.7083628\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power conversion circuits often apply AC waveforms to metallized plastic film capacitors whose characterization is largely based on DC testing. This paper describes failure mechanisms introduced by high-stress AC waveforms and ways of minimizing such failures.\",\"PeriodicalId\":165849,\"journal\":{\"name\":\"1981 IEEE Power Electronics Specialists Conference\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1981-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1981 IEEE Power Electronics Specialists Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PESC.1981.7083628\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1981 IEEE Power Electronics Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PESC.1981.7083628","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability considerations for metallized plastic film capacitors under high-stress AC waveforms
Power conversion circuits often apply AC waveforms to metallized plastic film capacitors whose characterization is largely based on DC testing. This paper describes failure mechanisms introduced by high-stress AC waveforms and ways of minimizing such failures.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
