老化对微带线辐射发射影响的模拟

2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems Pub Date : 2011-04-18 DOI:10.1109/ESIME.2011.5765837

H. Fridhi, G. Duchamp, V. Vigneras

{"title":"老化对微带线辐射发射影响的模拟","authors":"H. Fridhi, G. Duchamp, V. Vigneras","doi":"10.1109/ESIME.2011.5765837","DOIUrl":null,"url":null,"abstract":"This paper deals with the influence of humidity and temperature stresses on a microstrip line. These aging factors induce degradation on the dielectric and geometric properties. So the aim of this study is the evaluation of the influence of such variations on the radiated emission of a microstrip line using electromagnetic simulator. Due to the difficulty to interpret and analyze the results because of the correlation between the parameters, we have established a Design Of Experiments (DOE) to optimize the simulation procedure. The result coupled to ANOVA method gives better knowledge on the influence's factors. The study's conclusions lead to simplify the experiment's tests.","PeriodicalId":115489,"journal":{"name":"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Simulation of aging effects on radiated emission of microstrip line\",\"authors\":\"H. Fridhi, G. Duchamp, V. Vigneras\",\"doi\":\"10.1109/ESIME.2011.5765837\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper deals with the influence of humidity and temperature stresses on a microstrip line. These aging factors induce degradation on the dielectric and geometric properties. So the aim of this study is the evaluation of the influence of such variations on the radiated emission of a microstrip line using electromagnetic simulator. Due to the difficulty to interpret and analyze the results because of the correlation between the parameters, we have established a Design Of Experiments (DOE) to optimize the simulation procedure. The result coupled to ANOVA method gives better knowledge on the influence's factors. The study's conclusions lead to simplify the experiment's tests.\",\"PeriodicalId\":115489,\"journal\":{\"name\":\"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2011.5765837\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2011.5765837","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

本文研究了湿度和温度应力对微带线的影响。这些老化因素引起介电性能和几何性能的退化。因此，本研究的目的是利用电磁模拟器来评估这些变化对微带线辐射发射的影响。由于参数之间存在相关性，结果难以解释和分析，我们建立了实验设计(DOE)来优化模拟过程。结果与方差分析方法相结合，可以更好地了解影响因素。这项研究的结论有助于简化实验的测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Simulation of aging effects on radiated emission of microstrip line

This paper deals with the influence of humidity and temperature stresses on a microstrip line. These aging factors induce degradation on the dielectric and geometric properties. So the aim of this study is the evaluation of the influence of such variations on the radiated emission of a microstrip line using electromagnetic simulator. Due to the difficulty to interpret and analyze the results because of the correlation between the parameters, we have established a Design Of Experiments (DOE) to optimize the simulation procedure. The result coupled to ANOVA method gives better knowledge on the influence's factors. The study's conclusions lead to simplify the experiment's tests.

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2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems

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