{"title":"基于RBF神经网络的电子设备故障诊断算法研究","authors":"Lei Yuan, Heming Zhao","doi":"10.1109/IPTC.2011.26","DOIUrl":null,"url":null,"abstract":"This paper proposes an algorithm of failure diagnosis for electronic device. This algorithm can train existed failure diagnosis parameter sample sets, analysis internal relationship of diagnosis parameters and obtain the final result for device diagnosis, which achieves diagnosis adaptation about further sample parameter of device failure diagnosis. The advantage of algorithm is to optimize training process and control result of empirical function due to considering the prediction accuracy and training time of RBF in the constructing process.","PeriodicalId":388589,"journal":{"name":"2011 2nd International Symposium on Intelligence Information Processing and Trusted Computing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Research of Electronic Equipment Fault Diagnosis Algorithm Based on RBF Neural Network\",\"authors\":\"Lei Yuan, Heming Zhao\",\"doi\":\"10.1109/IPTC.2011.26\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes an algorithm of failure diagnosis for electronic device. This algorithm can train existed failure diagnosis parameter sample sets, analysis internal relationship of diagnosis parameters and obtain the final result for device diagnosis, which achieves diagnosis adaptation about further sample parameter of device failure diagnosis. The advantage of algorithm is to optimize training process and control result of empirical function due to considering the prediction accuracy and training time of RBF in the constructing process.\",\"PeriodicalId\":388589,\"journal\":{\"name\":\"2011 2nd International Symposium on Intelligence Information Processing and Trusted Computing\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 2nd International Symposium on Intelligence Information Processing and Trusted Computing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPTC.2011.26\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 2nd International Symposium on Intelligence Information Processing and Trusted Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPTC.2011.26","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research of Electronic Equipment Fault Diagnosis Algorithm Based on RBF Neural Network
This paper proposes an algorithm of failure diagnosis for electronic device. This algorithm can train existed failure diagnosis parameter sample sets, analysis internal relationship of diagnosis parameters and obtain the final result for device diagnosis, which achieves diagnosis adaptation about further sample parameter of device failure diagnosis. The advantage of algorithm is to optimize training process and control result of empirical function due to considering the prediction accuracy and training time of RBF in the constructing process.