{"title":"故障仿真分析与比较","authors":"Yan Zhang, Yong Guan, Guohui Wang","doi":"10.1109/IUCE.2009.15","DOIUrl":null,"url":null,"abstract":"With the development of VLSI¿circuit Design for Testability has become the focus of attention. Fault diagnosis and detection VLSI has become an important part of the development of essential. This paper is based on DFT theory as background, introduced the concept of fault simulation. Then introduce several fault simulation algorithm. And they conducted a comparative analysis. This paper expounds fault simulation algorithms on the improvement and development direction.","PeriodicalId":153560,"journal":{"name":"2009 International Symposium on Intelligent Ubiquitous Computing and Education","volume":"145 11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis and Comparison of Fault Simulation\",\"authors\":\"Yan Zhang, Yong Guan, Guohui Wang\",\"doi\":\"10.1109/IUCE.2009.15\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the development of VLSI¿circuit Design for Testability has become the focus of attention. Fault diagnosis and detection VLSI has become an important part of the development of essential. This paper is based on DFT theory as background, introduced the concept of fault simulation. Then introduce several fault simulation algorithm. And they conducted a comparative analysis. This paper expounds fault simulation algorithms on the improvement and development direction.\",\"PeriodicalId\":153560,\"journal\":{\"name\":\"2009 International Symposium on Intelligent Ubiquitous Computing and Education\",\"volume\":\"145 11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Symposium on Intelligent Ubiquitous Computing and Education\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IUCE.2009.15\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Symposium on Intelligent Ubiquitous Computing and Education","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IUCE.2009.15","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
With the development of VLSI¿circuit Design for Testability has become the focus of attention. Fault diagnosis and detection VLSI has become an important part of the development of essential. This paper is based on DFT theory as background, introduced the concept of fault simulation. Then introduce several fault simulation algorithm. And they conducted a comparative analysis. This paper expounds fault simulation algorithms on the improvement and development direction.
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