J. Pak, Jingook Kim, Jung-gun Byun, Heejae Lee, Joungho Kim
{"title":"多层PCB中通孔信号经电源/地谐振耦合及边缘辐射激励","authors":"J. Pak, Jingook Kim, Jung-gun Byun, Heejae Lee, Joungho Kim","doi":"10.1109/ISEMC.2003.1236597","DOIUrl":null,"url":null,"abstract":"This paper describes the edge radiation of signal power at multi-layer PCB mostly depends on coupling of through-hole signal via to power/ground plane, and the coupling mechanism is the loading effects of power/ground plane impedance on signal return current. It is well known that the variation of power/ground impedance comes from power/ground resonance, and the variation range is up to several tens ohm (/spl Omega/). In 50/spl Omega/ system, this range impedance makes signal input matching worse. Moreover, the transmitted signal is divided into two parts, load and power/ground plane. Finally, the assimilated signal power by power/ground plane is emitted from PCB open edge, which is a good radiation structure. Above analysis is shown in this paper by Spice modeling of through-hole signal via and power/ground plane and measuring the near field strength at PCB edge with/without through-hole signal via cases. The loading effects are seen in S-parameters and input impedance of signal traces and PCB edge radiation in |S21| between signal trace and near field probe. The trace with through-hole signal via case has the larger radiated emission at PCB edge than without case by more than 20dB.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"Coupling of through-hole signal via to power/ground resonance and excitation of edge radiation in multi-layer PCB\",\"authors\":\"J. Pak, Jingook Kim, Jung-gun Byun, Heejae Lee, Joungho Kim\",\"doi\":\"10.1109/ISEMC.2003.1236597\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the edge radiation of signal power at multi-layer PCB mostly depends on coupling of through-hole signal via to power/ground plane, and the coupling mechanism is the loading effects of power/ground plane impedance on signal return current. It is well known that the variation of power/ground impedance comes from power/ground resonance, and the variation range is up to several tens ohm (/spl Omega/). In 50/spl Omega/ system, this range impedance makes signal input matching worse. Moreover, the transmitted signal is divided into two parts, load and power/ground plane. Finally, the assimilated signal power by power/ground plane is emitted from PCB open edge, which is a good radiation structure. Above analysis is shown in this paper by Spice modeling of through-hole signal via and power/ground plane and measuring the near field strength at PCB edge with/without through-hole signal via cases. The loading effects are seen in S-parameters and input impedance of signal traces and PCB edge radiation in |S21| between signal trace and near field probe. The trace with through-hole signal via case has the larger radiated emission at PCB edge than without case by more than 20dB.\",\"PeriodicalId\":359422,\"journal\":{\"name\":\"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2003.1236597\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2003.1236597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Coupling of through-hole signal via to power/ground resonance and excitation of edge radiation in multi-layer PCB
This paper describes the edge radiation of signal power at multi-layer PCB mostly depends on coupling of through-hole signal via to power/ground plane, and the coupling mechanism is the loading effects of power/ground plane impedance on signal return current. It is well known that the variation of power/ground impedance comes from power/ground resonance, and the variation range is up to several tens ohm (/spl Omega/). In 50/spl Omega/ system, this range impedance makes signal input matching worse. Moreover, the transmitted signal is divided into two parts, load and power/ground plane. Finally, the assimilated signal power by power/ground plane is emitted from PCB open edge, which is a good radiation structure. Above analysis is shown in this paper by Spice modeling of through-hole signal via and power/ground plane and measuring the near field strength at PCB edge with/without through-hole signal via cases. The loading effects are seen in S-parameters and input impedance of signal traces and PCB edge radiation in |S21| between signal trace and near field probe. The trace with through-hole signal via case has the larger radiated emission at PCB edge than without case by more than 20dB.