高压硅堆击穿原因分析及器件修复

Hanmin Ye, Qianting Sun
{"title":"高压硅堆击穿原因分析及器件修复","authors":"Hanmin Ye, Qianting Sun","doi":"10.1109/IAEAC.2015.7428521","DOIUrl":null,"url":null,"abstract":"This paper introduces the reason for the high voltage silicon stack broken down for the high voltage generator and the method of improvement is proposed. The machine operation shows that the method is correct.","PeriodicalId":398100,"journal":{"name":"2015 IEEE Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis on reason for high voltage silicon stack breakdown and device repaired\",\"authors\":\"Hanmin Ye, Qianting Sun\",\"doi\":\"10.1109/IAEAC.2015.7428521\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces the reason for the high voltage silicon stack broken down for the high voltage generator and the method of improvement is proposed. The machine operation shows that the method is correct.\",\"PeriodicalId\":398100,\"journal\":{\"name\":\"2015 IEEE Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IAEAC.2015.7428521\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAEAC.2015.7428521","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

介绍了高压发电机高压硅堆击穿的原因,并提出了改进方法。机器运行表明该方法是正确的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis on reason for high voltage silicon stack breakdown and device repaired
This paper introduces the reason for the high voltage silicon stack broken down for the high voltage generator and the method of improvement is proposed. The machine operation shows that the method is correct.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信