外微波辐射下屏蔽共振模式下电子外壳穿透能量的估算

2017 International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON) Pub Date : 2017-09-01 DOI:10.1109/SIBIRCON.2017.8109921

V. Butin, P. Kundyshev

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引用次数: 1

摘要

本文研究了在微波照射下，电子屏蔽体在屏蔽效能共振降低的最坏情况下，其内部存储能量的估计。提出了一种由外部微波通过狭缝激发的电磁谐振器概念屏蔽箱。得到了一阶近似模拟实际电子学外壳的圆柱外壳的狭缝内电压降和能量积累的数值表达式。试验计算表明，其存储能量可超过几个微焦耳，达到典型的易受微波辐射影响的电子元件和器件的退化水平。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Estimation of energy penetration through the electronics housing under external microwave radiation in the resonance mode of shielding

In this paper the estimation of the energy stored inside the electronics shield under microwave exposure that can damage its components in the worst case of shielding effectiveness resonance decreasing is under investigation. The shielding box acting as electromagnetic resonator concept excited by exterior microwaves through the narrow slit was stated. The numerical expressions of both voltage drop in the slit and energy accumulated in the cylindrical enclosure that in first approximation modeled the real electronics housing are obtained. Test calculation shows the stored energy can exceed of several micro joules that tend to reach the degradation level of the typical electronic components and devices susceptible to microwave irradiation.

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来源期刊

2017 International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON)

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