Tugçe Ayraç, Anıl Özdemirli, Emre Apaydin, Kemal Ozanoglu, M. Yazgi
{"title":"印刷电路板测量中多线TRL和2x直通去嵌入实现方法的比较评价","authors":"Tugçe Ayraç, Anıl Özdemirli, Emre Apaydin, Kemal Ozanoglu, M. Yazgi","doi":"10.1109/SMACD58065.2023.10192140","DOIUrl":null,"url":null,"abstract":"This work presents a comprehensive study of two different de-embedding techniques: the Multiline method and the 2X-Thru fixture removal. The methods are compared in terms of calibration standard requirements, de-embedding methodology, fixture removing accuracy, and de-embedding results. The comparison reveals that the accuracy of the Multiline method strictly depends on the impedance variation between calibration standards. The 2X-Thru with impedance correction, on the other hand, is more prone to impedance variation since it relies on a single calibration standard, which also eases the measurement routine and reduces the complexity. One important aim of this study is to contribute to the development of open-source de-embedding tools since the validity and accuracy of commercial tools cannot be evaluated for academic purposes.","PeriodicalId":239306,"journal":{"name":"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Comparative Evaluation of Multiline TRL and 2X-Thru De-Embedding Implementation Methods on Printed Circuit Board Measurements\",\"authors\":\"Tugçe Ayraç, Anıl Özdemirli, Emre Apaydin, Kemal Ozanoglu, M. Yazgi\",\"doi\":\"10.1109/SMACD58065.2023.10192140\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a comprehensive study of two different de-embedding techniques: the Multiline method and the 2X-Thru fixture removal. The methods are compared in terms of calibration standard requirements, de-embedding methodology, fixture removing accuracy, and de-embedding results. The comparison reveals that the accuracy of the Multiline method strictly depends on the impedance variation between calibration standards. The 2X-Thru with impedance correction, on the other hand, is more prone to impedance variation since it relies on a single calibration standard, which also eases the measurement routine and reduces the complexity. One important aim of this study is to contribute to the development of open-source de-embedding tools since the validity and accuracy of commercial tools cannot be evaluated for academic purposes.\",\"PeriodicalId\":239306,\"journal\":{\"name\":\"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMACD58065.2023.10192140\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMACD58065.2023.10192140","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparative Evaluation of Multiline TRL and 2X-Thru De-Embedding Implementation Methods on Printed Circuit Board Measurements
This work presents a comprehensive study of two different de-embedding techniques: the Multiline method and the 2X-Thru fixture removal. The methods are compared in terms of calibration standard requirements, de-embedding methodology, fixture removing accuracy, and de-embedding results. The comparison reveals that the accuracy of the Multiline method strictly depends on the impedance variation between calibration standards. The 2X-Thru with impedance correction, on the other hand, is more prone to impedance variation since it relies on a single calibration standard, which also eases the measurement routine and reduces the complexity. One important aim of this study is to contribute to the development of open-source de-embedding tools since the validity and accuracy of commercial tools cannot be evaluated for academic purposes.