基于arm单片机的USB接口JTAG仿真器的设计与实现

Xuhui Chen, Dengyi Zhang, Hongyun Yang
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引用次数: 8

摘要

边界扫描技术是一种流行的测试设计技术,一些嵌入式芯片通过在电路中嵌入特殊的边界扫描单元来采用这种技术。它允许调试器通过JTAG端口直接与IC的核心通信。随着越来越多的芯片采用JTAG接口,JTAG仿真器的应用也越来越频繁。市场上使用并口的商用JTAG仿真器通常价格昂贵且不方便。本文介绍了两种基于ARM单片机的廉价USB接口JTAG仿真器的设计方法,包括它们的硬件和软件。一种是ARM设备的GPIO引脚用于生成TAP时序,其USB端口用于与PC机通信。另一种是使用SPI接口产生更高的TCK。结果表明,该仿真器不仅速度快,而且便携。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and Implementation of a Single-Chip ARM-Based USB Interface JTAG Emulator
Boundary-scan technology is a popular design-for-test technology, which is used by some embedded chips by means of embedding special boundary scan cells inside the circuits. It allows the debugger to talk via a JTAG port directly to the IC's core. As more and more chips using the JTAG interface, the application of JTAG emulator becomes frequent. Commercial JTAG emulators using parallel port on the market are usually expensive and inconvenience. This paper describes two methods to design an inexpensive USB interface JTAG emulator based on a single-chip ARM, including theirs hardware and software. One is the GPIO pins of an ARM device are used to generate TAP timing and its USB port is used to communicate with PC. Another is used the SPI interface to generate higher TCK. Result shows that this emulator not only has high speed but also is portable.
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