{"title":"耦合电感分析与设计","authors":"Slobodan Cuk, Zhe Zhang","doi":"10.1109/PESC.1986.7415621","DOIUrl":null,"url":null,"abstract":"A new coupled-inductor multiple air-gap structure is proposed and analyzed. These EI and EE core configurations eliminate many of the problems associated with the earlier single air-gap structures such as: high sensitivity of ripple currents to air-gap and/or turns ratio changes, complex winding arrangements and consequent high costs and inferior thermal characteristics. To facilitate the design, critical leakage parameter I is evaluated for a whole line of EI and EE cores.","PeriodicalId":164857,"journal":{"name":"1986 17th Annual IEEE Power Electronics Specialists Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"68","resultStr":"{\"title\":\"Coupled-inductor analysis and design\",\"authors\":\"Slobodan Cuk, Zhe Zhang\",\"doi\":\"10.1109/PESC.1986.7415621\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new coupled-inductor multiple air-gap structure is proposed and analyzed. These EI and EE core configurations eliminate many of the problems associated with the earlier single air-gap structures such as: high sensitivity of ripple currents to air-gap and/or turns ratio changes, complex winding arrangements and consequent high costs and inferior thermal characteristics. To facilitate the design, critical leakage parameter I is evaluated for a whole line of EI and EE cores.\",\"PeriodicalId\":164857,\"journal\":{\"name\":\"1986 17th Annual IEEE Power Electronics Specialists Conference\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"68\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 17th Annual IEEE Power Electronics Specialists Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PESC.1986.7415621\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 17th Annual IEEE Power Electronics Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PESC.1986.7415621","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new coupled-inductor multiple air-gap structure is proposed and analyzed. These EI and EE core configurations eliminate many of the problems associated with the earlier single air-gap structures such as: high sensitivity of ripple currents to air-gap and/or turns ratio changes, complex winding arrangements and consequent high costs and inferior thermal characteristics. To facilitate the design, critical leakage parameter I is evaluated for a whole line of EI and EE cores.