{"title":"高压直流系统中模块化多电平变换器的可靠性改进","authors":"Stefano Farnesi, M. Marchesoni, L. Vaccaro","doi":"10.1109/PSCC.2016.7540942","DOIUrl":null,"url":null,"abstract":"In this paper the reliability of a Modular Multilevel Converter for HVDC applications is incremented, by decreasing the electrical stress of the main passive component suitable to fault, that is, the capacitor cell. This effect is obtained with the injection of a suitable cell second harmonic circulating current. It's important to note how the cell current increment does not increase the semiconductor losses, but in some circumstances can even decrease such losses.","PeriodicalId":265395,"journal":{"name":"2016 Power Systems Computation Conference (PSCC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Reliability improvement of Modular Multilevel Converter in HVDC systems\",\"authors\":\"Stefano Farnesi, M. Marchesoni, L. Vaccaro\",\"doi\":\"10.1109/PSCC.2016.7540942\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper the reliability of a Modular Multilevel Converter for HVDC applications is incremented, by decreasing the electrical stress of the main passive component suitable to fault, that is, the capacitor cell. This effect is obtained with the injection of a suitable cell second harmonic circulating current. It's important to note how the cell current increment does not increase the semiconductor losses, but in some circumstances can even decrease such losses.\",\"PeriodicalId\":265395,\"journal\":{\"name\":\"2016 Power Systems Computation Conference (PSCC)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Power Systems Computation Conference (PSCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PSCC.2016.7540942\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Power Systems Computation Conference (PSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PSCC.2016.7540942","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability improvement of Modular Multilevel Converter in HVDC systems
In this paper the reliability of a Modular Multilevel Converter for HVDC applications is incremented, by decreasing the electrical stress of the main passive component suitable to fault, that is, the capacitor cell. This effect is obtained with the injection of a suitable cell second harmonic circulating current. It's important to note how the cell current increment does not increase the semiconductor losses, but in some circumstances can even decrease such losses.