Scan-based testability for fault-tolerant architectures

The acceptance and use of standard scan-based test access ports (TAPs), such as the IEEE-1149.1-1990 standard, have begun to ease the task of system testability and in-circuit diagnostics. The typical singular nature of these TAPs along with the all-or-nothing manner in which test facilities are accessed make such standard TAPs inappropriate for use in fault-tolerant architectures. The authors propose three simple additions to standard scan practices which allow scan techniques to be effectively utilized in fault-tolerant environments. Specifically, they advocate the incorporation of multiple-TAPs, port-by-port selection control, and partial external scan. Multi-TAP construction offers tolerance to faults in the scan path or circuitry. Port-by-port selection and partial external scan allow fault-diagnostics which are minimally intrusive and in-operation reconfiguration for fault-masking and repair.<>